IVC-22

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Parallel Sessions

Scanning Probe Microscopy

[Mon-C2] Scanning Probe Microscopy

Mon. Sep 12, 2022 3:30 PM - 5:30 PM Room C (Mid-sized Hall A)

4:30 PM - 4:45 PM

[Mon-C2-5] Award Applied
A polymer melt on mica and graphite investigated by bimodal AFM with a long probe qPlus sensor

*Yuya Yamada1, Takashi Ichii1, Toru Utsunomiya1, Hiroyuki Sugimura1 (1. Kyoto University (Japan))

Keywords:bimodal AFM, qPlus sensor, polymer melt

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