IVC-22

Presentation information

Poster Session

Poster Session (17:30-19:00)

[Mon-PO1A] Poster Session (17:30-19:00) Category A

Mon. Sep 12, 2022 5:30 PM - 7:00 PM Poster A (Main Hall)

[Mon-PO1A-7] Award Applied
Control of Radical/Ion Flux Ratio of Reactive Ion Beam Etching (RIBE) using Dual Exhaust system

*YunJong Jang1, DooSan Kim1, HongSeong Gil1, HaeIn Kwon1, GeunYoung Yeom1,2 (1. School of Advanced Materials Science and Engineering, Sungkyunkwan Universtiy (Korea), 2. SKKU Advanced Institute of Nano Technology (SAINT), Sungkyunkwan Universtiy (Korea))

Keywords:Reactive Ion Etching (RIE), Reactive Ion Beam Etching (RIBE), Plasma, Radical, Etch Profile

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