[Mon-PO1B] Poster Session (17:30-19:00) Category B

[Mon-PO1B-28] Award Applied
Luminance histogram analysis of RHEED images using machine learning approach

*Asako Yoshinari^1,2, Yasunobu Ando³, Tarojiro Matsumura³, Masato Kotsugi¹, Naoka Nagamura^1,2,4 (1. Tokyo University of Science (Japan), 2. National Institute for Materials Science (Japan), 3. National Institute of Advanced Industrial Science and Technology (Japan), 4. Japan Science and Technology Agency (Japan))

Keywords:RHEED, machine learning, surface superstructure