[Mon-PO1B] Poster Session (17:30-19:00) Category B

[Mon-PO1B-28] Award Applied
Luminance histogram analysis of RHEED images using machine learning approach

*Asako Yoshinari^1,2, Yasunobu Ando³, Tarojiro Matsumura³, Masato Kotsugi¹, Naoka Nagamura^1,2,4 (1. Tokyo University of Science (Japan), 2. National Institute for Materials Science (Japan), 3. National Institute of Advanced Industrial Science and Technology (Japan), 4. Japan Science and Technology Agency (Japan))

キーワード：RHEED, machine learning, surface superstructure