[Mon-PO1F] Poster Session (17:30-19:00) Category F

[Mon-PO1F-3] Machine learning for Atomic Force Microscope image interpretation and device operation

*Niko Oinonen¹, Lauri Kurki¹, Chen Xu¹, Shuning Cai¹, Markus Aapro¹, Filippo Federici Canova^1,3, Alexander Ilin², Peter Liljeroth¹, Adam S. Foster^1,4 (1. Aalto University, Department of Applied Physics (Finland), 2. Aalto University, Department of Computer Science (Finland), 3. Nanolayers Research Computing Ltd. (UK), 4. WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University (Japan))

Keywords:Atomic force microscopy, Scanning probe microscopy, Machine learning, Automation