[Thu-C1] Scanning Probe Microscopy

[Thu-C1-2] Award Applied
Direct Observation of Ion Migration in Amorphous TaO_x-Based Electronic Synapses

*Atsushi Tsurumaki-Fukuchi¹, Takayoshi Katase², Hiromichi Ohta¹, Masashi Arita¹, Yasuo Takahashi¹ (1. Hokkaido University (Japan), 2. Tokyo Institute of Technology (Japan))

キーワード：Memristor, Neuromorphic device, Amorphous oxide, Scanning probe microscopy, Artificial synapses