[Thu-C2] Scanning Probe Microscopy

[Thu-C2-6] Award Applied
Electrostatic forces and island growth on Pb/Si(111)-(7x7)

*Paul Philip Schmidt¹, Ben Lottenburger¹, Daniel Rothhardt¹, Regina Hoffmann-Vogel¹ (1. University Potsdam (Germany))

キーワード：Scanning force microscopy, surface forces, Kelvin probe force microscopy, quantum size effect