[Thu-C2] Scanning Probe Microscopy

[Thu-C2-8] Tunable narrow bands in twisted double bilayer graphene probed by Landau level spectroscopy

*Marlou R. Slot^1,2, Yulia Maximenko^1,3, Sungmin Kim^1,3, Daniel T. Walkup¹, Evgheni Strelcov^1,2, En-Min Shih^1,2, Dilek Yildiz^1,3, Steven R. Blankenship¹, Kenji Watanabe⁴, Takashi Taniguchi⁴, Yafis Barlas⁵, Paul M. Haney¹, Nikolai B. Zhitenev¹, Fereshte Ghahari⁶, Joseph A. Stroscio¹ (1. NIST (United States of America), 2. Georgetown Univ. (United States of America), 3. Univ. of Maryland (United States of America), 4. NIMS (Japan), 5. Univ. of Nevada, Reno (United States of America), 6. George Mason Univ. (United States of America))

キーワード：Twistronics, Van der Waals materials, Scanning Tunneling Microscopy, Landau level spectroscopy