[Thu-E1] Nanometer Structures

[Thu-E1-2] Uniaxial stress-driven one-dimensional reconstructed silicon surfaces

*Hidehito Asaoka¹, Masahiro Yano¹, Tomo-o Terasawa¹, Satoshi Yasuda¹ (1. Advanced Science Research Center, JAEA (Japan))

Keywords:stress, low-dimention, reconstruction, silicon