IVC-22

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Parallel Sessions

Applied Surface Science

[Thu-J1] Applied Surface Science

Thu. Sep 15, 2022 10:15 AM - 12:00 PM Room J (Meeting Room 207)

10:45 AM - 11:15 AM

[Thu-J1-3I] Efforts to Improve XPS Analysis Quality in an Era of Increasingly Diverse Uses and Users

*Donald Ray Baer1 (1. Pacific Northwest National Laboratory (United States of America))

Keywords:XPS, Surface Analysis, reproducibility, peak fitting, reporting

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