<strong>Efforts to Improve XPS Analysis Quality in an Era of Increasingly Diverse Uses and Users</strong><strong></strong>

10:45 〜 11:15

[Thu-J1-3I] Efforts to Improve XPS Analysis Quality in an Era of Increasingly Diverse Uses and Users

*Donald Ray Baer¹ (1. Pacific Northwest National Laboratory (United States of America))

キーワード：XPS, Surface Analysis, reproducibility, peak fitting, reporting

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