[Tue-E1] Electronic Materials and Processing

[Tue-E1-5] Hydrogen defect clustering in strained SiGe host matrixes

*Mitsuki Kano¹, Satoru Miyamoto¹, Yasuyoshi Kurokawa¹, Noritaka Usami¹ (1. Nagoya Univ. (Japan))

キーワード：Hydrogen, Semiconductor, Defect, Strain