[Tue-F1] Joint session of Advanced light spectroscopy and Surface Science

[Tue-F1-5] Direct probing and identification of the origin of two-step photon absorption in GaAs thin film by first-principles spin-orbit calculations and STM/STS measurements

*Mary Clare Escano¹, Maria Herminia Balgos^2,3, Tien Quang Nguyen⁴, Elizabeth Ann Prieto^5,6, Elmer Estacio⁵, Arnel Salvador⁵, Armando Somintac⁵, Rafael Jaculbia³, Norihiko Hayazawa³, Yousoo Kim³, Masahiko Tani¹ (1. Research Center for Development of Far-Infrared Region, University of Fukui (Japan), 2. Innovative Photon Manipulation Research Team, RIKEN Center for Advanced Photonics (Japan), 3. Surface and Interface Science Laboratory, RIKEN (Japan), 4. Research Initiative for Supra-Materials, Shinshu University (Japan), 5. National Institute of Physics, University of the Philippines (Philippines), 6. Materials Science and Engineering Program, University of the Philippines (Philippines))

キーワード：semiconductor defects, two-step photon absorption, LT-GaAs , STM/STS , DFT-SO , terahertz radiation