[Tue-PO1C] Poster Session (17:00-18:30) Category C

[Tue-PO1C-12] Verification of surface irregularities by a photoelectron spectrometer

*Kenichi Ozawa^1,2, Keita Hiromori³, Nobuo Nakajima³, Kazuhiko Mase^1,2 (1. KEK (Japan), 2. SOKENDAI (Japan), 3. Hiroshima Univ. (Japan))

キーワード：photoelectron spectroscopy, high precision sample manipulation, microchannel plate image, microfocus beam