[Tue-PO1F] Poster Session (17:00-18:30) Category F

[Tue-PO1F-1] Award Applied
Scanning ion conductance microscopy with capacitance compensation using a double barrel nanopipette for improving current detection response

*Naoto Fukuzawa¹, Kenta Nakazawa¹, Futoshi Iwata¹ (1. Shizuoka University (Japan))

Keywords:Scanning ion conductance microscopy, Nanopipette