IVC-22

Presentation information

Parallel Sessions

Scanning Probe Microscopy

[Wed-C2] Scanning Probe Microscopy

Wed. Sep 14, 2022 4:30 PM - 6:30 PM Room C (Mid-sized Hall A)

4:30 PM - 4:45 PM

[Wed-C2-1] Internal standard method of diamond nanoparticle size measurement using co-distributed spherical nanoparticles

*Tomihiro Hashizume1,2, Tomoo Sigehuzi3, Takashi Tokizaki3, Takafumi Miwa4,2, Masatoshi Yasutake5 (1. R&D Group, Hitachi, Ltd. Hatoyama (Japan), 2. Dep. of Physics, Tokyo Inst. Technol. (Japan), 3. AIST (Japan), 4. R&D Group, Hitachi, Ltd. Kokubunji (Japan), 5. Hitachi High-Tech Co. (Japan))

Keywords:AFM, nanoparticle, internal standard method , size measurement

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