[Wed-C2] Scanning Probe Microscopy

[Wed-C2-1] Internal standard method of diamond nanoparticle size measurement using co-distributed spherical nanoparticles

*Tomihiro Hashizume^1,2, Tomoo Sigehuzi³, Takashi Tokizaki³, Takafumi Miwa^4,2, Masatoshi Yasutake⁵ (1. R&D Group, Hitachi, Ltd. Hatoyama (Japan), 2. Dep. of Physics, Tokyo Inst. Technol. (Japan), 3. AIST (Japan), 4. R&D Group, Hitachi, Ltd. Kokubunji (Japan), 5. Hitachi High-Tech Co. (Japan))

キーワード：AFM, nanoparticle, internal standard method , size measurement