[Wed-C2] Scanning Probe Microscopy

[Wed-C2-5] Award Applied
Toward atomic-scale scattering-type scanning near-field optical microscopy based on noncontact atomic force microscopy

*Akitoshi Shiotari¹, Melanie Müller¹, Fabian Schulz¹, Adnan Hammud², Shuyi Liu¹, Jun Nishida³, Takashi Kumagai³, Martin Wolf¹ (1. Dept. Phys. Chem., Fritz Haber Institute (Germany), 2. Dept. Inorg. Chem., Fritz Haber Institute (Germany), 3. Institute for Molecular Science (Japan))

キーワード：Frequency modulation atomic force microscopy, Scattering-type scanning near-field optical microscopy, nanoscale plasmonics, scanning probe microscopy, microscopic measurement technique