IVC-22

Presentation information

Print

Parallel Sessions

Scanning Probe Microscopy

[Wed-C2] Scanning Probe Microscopy

Wed. Sep 14, 2022 4:30 PM - 6:30 PM Room C (Mid-sized Hall A)

5:45 PM - 6:00 PM

[Wed-C2-6] Local impedance measurement by directly detecting oscillation of electrostatic potential

*Nobuyuki Ishida1 (1. National Institute for Materials Science (Japan))

Keywords:scanning impedance microscopy, Kelvin probe force microscopy, solid electrolyte

Please log in with your participant account.
» Participant Log In