[Wed-PO1F] Poster Session (12:30-14:00) Category F

[Wed-PO1F-6] Award Applied
Measurement of Local Work Function Using Ultrafast Voltage Pulse Scanning Probe Microscopy

*Emiko Murata¹, Hibiki Hikasa¹, Daiki Katsube², Masayuki Abe³, Eiichi Inami¹ (1. Kochi Univ. of Tech. (Japan), 2. Nagaoka Univ. of Tech. (Japan), 3. Osaka Univ. (Japan))

Keywords:Scanning Probe Microscopy , Work Function, Local Barrier Height , Contact Potential Difference