[Wed-J2] Applied Surface Science

[Wed-J2-4] Electronic state analysis of graphene edges using scanning photoelectron microscopy under gate-controlled ultraviolet oxidization

*Naoka Nagamura^1,2,3, Shun Konno², Morihiro Matsumoto⁴, Masato Kotsugi², Masaharu Oshima⁵, Ryo Nouchi^4,3 (1. National Institute for Materials Science (Japan), 2. Tokyo University of Science (Japan), 3. PRESTO, Japan Science and Technology Agency (Japan), 4. Osaka Metropolitan University (Japan), 5. The University of Tokyo (Japan))

キーワード：Graphene, XPS, Scanning Photoelectron Microscopy, Synchrotron X-rays, Photo Oxidation Reaction