R2: Crystal structure, crystal chemistry, physical properties of minerals, crystal growth and applied mineralogy

[R2-08] Single-crystal synchrotron X-ray diffraction study on a new Al₂Si₂O₇ phase synthesized at the condition of 15.5 GPa and 2473 K

*Takahiro Kuribayashi¹, Youmo Zhou², Hiroaki Ohfuji², Tetsuo Irifune^2,3 (1. Tohoku Univ., 2. Ehime Univ. GRC, 3. Inst. Tech. Tokyo. ELS)

Keywords:newly synthesized Al2Si2O7, Single-crystal X-ray diffraction, synchrotron, crystal structure

Single-crystal synchrotron X-ray diffraction study on a new Al₂Si₂O₇ phase synthesized at the condition of 15.5 GPa and 2473 K were conducted to determine the crystal structure of the new phase. In this report, the detailed structural information of the new Al₂Si₂O₇ phase will be shown.