Quarity contorol method for CMC-based slurry

Presentation information

General session

6. 地盤と構造物 (動的問題を含む)

Wed. Jul 22, 2020 1:20 PM - 2:50 PM Room No. 9

*Yasuharu Wachi¹, Shinya Matsushita² (1. Tokyo Buildhing Construction Division，Obayashi Corporation, 2. Matsushita M&C Lab Co.Ltd)

Keywords:CMC-based slurry, Quality Control, Concentration loss rate

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