[G] Mechanical Properties of Materials and Sturucture (1)

Wed. Sep 15, 2021 9:00 AM - 10:00 AM Rm. D (ZoomRm.D)

座長:岸田恭輔(京都大学)

※表示の講演時間には質疑応答時間も含みます。
（質疑応答時間5分、基調講演と招待講演は5～10分）

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9:00 AM - 9:15 AM

[17] Reliability analysis of electronic device by using synchrotron X-ray nano-CT
: Microstructural evolution of electrodes of MLCC

*Gaku OKUMA^1,2, Naoya SAITO², Kotaro MIZUNO³, Fumihiro WAKAI² (1. National Institute for Materials Science, 2. Tokyo Institute of Technology, 3. Taiyo Yuden Co., Ltd)

9:15 AM - 9:30 AM

[18] Formation of metastable Si-rich SiGe phase by severe plastic deformation under high pressure

*Marina TAKAIRA¹, Yoshifumi IKOMA², Yasutomo ARAI³, Masamichi KOHNO², Yukiko OZAKI² (1. 九大工(院生)、2. 九大工、3. JAXA)

9:30 AM - 9:45 AM

[19] Grain size effect on strain localization behavior of pure aluminum

*Shigetaka HAKAMATA¹, Si GAO², Nobuhiro Tsuji^2,3 (1. 京大工(院生)、2. 京大工、3. ESISM)

9:45 AM - 10:00 AM

[20] Relationship between Activation Volume of Dislocation Motion and Tensile Property in Nanostructured Pure Fe Produced by HPT-straining and Annealing

*Yoshikazu TODAKA¹, Mikiaki SUGIURA², Hirokazu SATO¹, Akito TASAKI¹, Nozomu ADACHI¹ (1. Toyohashi Univ. of Tech., 2. Toyohashi Univ. of Tech. (Present: Plus Engineering Co., Ltd.))

Session information

[G] Mechanical Properties of Materials and Sturucture (1)

[17] Reliability analysis of electronic device by using synchrotron X-ray nano-CT
: Microstructural evolution of electrodes of MLCC

[18] Formation of metastable Si-rich SiGe phase by severe plastic deformation under high pressure

[19] Grain size effect on strain localization behavior of pure aluminum

[20] Relationship between Activation Volume of Dislocation Motion and Tensile Property in Nanostructured Pure Fe Produced by HPT-straining and Annealing

Authentication

Session information

[G] Mechanical Properties of Materials and Sturucture (1)

[17] Reliability analysis of electronic device by using synchrotron X-ray nano-CT: Microstructural evolution of electrodes of MLCC

[18] Formation of metastable Si-rich SiGe phase by severe plastic deformation under high pressure

[19] Grain size effect on strain localization behavior of pure aluminum

[20] Relationship between Activation Volume of Dislocation Motion and Tensile Property in Nanostructured Pure Fe Produced by HPT-straining and Annealing

Authentication

[17] Reliability analysis of electronic device by using synchrotron X-ray nano-CT
: Microstructural evolution of electrodes of MLCC