*T. Shinozaki¹ (1. NICT CiNet)

*Y. Sasaki¹, K. Nishida¹, M. Akai-Kasaya¹, T. Asai¹ (1. Graduate School of IST, Hokkaido University)

*S. Kan¹, K. Nakajima², T. Asai¹, M. Akai-Kasaya¹ (1. Hokkaido University, 2. The University of Tokyo)

*T. Sumi¹, H. Yamamoto¹, S. Moriya¹, T. Takemuro¹, S. Sato¹, A. Hirano-Iwata^1,2 (1. RIEC, Tohoku University, 2. AIMR, Tohoku University)

*H. Inoue¹, K. Hukushima^2,3, T. Omori^1,4 (1. Graduate School of Engineering, Kobe University, 2. Graduate School of Arts and Sciences, The University of Tokyo, 3. Komaba Institute for Science, The University of Tokyo, 4. Organization for Advanced and Integrated Research, Kobe University)

*N. Matsumoto¹, T. Omori^1,2 (1. Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 2. Center for Mathematical and Data Sciences, Kobe University)

K. Hattori¹, M. Ishida¹, H. Takahashi¹, S. Oguma¹, H. Yamamoto², A. Hirano-Iwata^2,3, *T. Tanii¹ (1. FSE, Waseda University, 2. RIEC, Tohoku University, 3. WPI-AIMR, Tohoku University)

*Y. Sato¹, H. Yamamoto¹, T. Takemuro¹, T. Sumi¹, T. Konno², S. Sato¹, A. Hirano-Iwata^1,3 (1. RIEC, Tohoku Tohoku University, 2. Graduate School of Pharmaceutical Sciences, Tohoku Tohoku University, 3. WPI-AIMR, Tohoku Tohoku University )

*Y. Kikuchi¹, T. Takemuro¹, M. Ono¹, G. Takamim¹, S. Otomo¹, Z. Ni² (1. Tohoku University, 2. Tokyo Electron Ltd.)

*D. Oguchi¹, Y. Kanke¹, M. Chiba¹, A. Saita¹, K. Kudou¹, Y. Sakamoto¹ (1. Tohoku University)

*A. Fujimoto¹, D. Choi¹, M. Inoue¹, R. Takahashi², S. Moribe¹, Y. Asakawa¹ (1. Tohoku University, 2. Tokyo Electron Ltd.)

*T. Nara¹, S. Tanaka¹, S. Kumagai¹, Y. Sato¹, K. Fukuda¹ (1. Tohoku University)