日本地球惑星科学連合2014年大会

講演情報

インターナショナルセッション(口頭発表)

セッション記号 P (宇宙惑星科学) » P-CG 宇宙惑星科学複合領域・一般

[P-CG11_28AM1] Instrumentation for space science

2014年4月28日(月) 10:00 〜 10:45 421 (4F)

コンビーナ:*松岡 彩子(宇宙航空研究開発機構 宇宙科学研究所 太陽系科学研究系)、吉川 一朗(東京大学)、座長:松岡 彩子(宇宙航空研究開発機構 宇宙科学研究所 太陽系科学研究系)、吉川 一朗(東京大学)

10:30 〜 10:45

[PCG11-P02_PG] Development of Electron Temperature and Density Probe (TeNeP) for Nano- and Micro-satellites -II

ポスター講演3分口頭発表枠

*JIANG Guo-siang1CHEN Wen-hao1HSU Yu-wei1OYAMA Koichiro2CHENG Chio2 (1.Institute of Space and Plasma Sciences, National Cheng Kung University、2.Plasma and Space Science Center, National Cheng Kung University)

キーワード:Electron Temperature and Density Probe, nano/micro-satellite, Electron Temperature, Electron Density, electrode surface contamination, satellite/probe area ratio

The nano/micro-satellite becomes popular for the study of near earth environment. To measure the electron temperature (Te) and electron density (Ne) in the ionosphere, we have developed the Electron Temperature and Density Probe (TeNeP). The TeNeP measures Te and Ne based on principles of electron temperature probe (ETP) and planar impedance probe (IP). By combining systems of ETP and IP, Te and Ne can be measured by one single probe. The TeNeP system has advantages not only as being small, light weighted and low power consumption that fulfills the needs of instruments onboard nano/micro-satellites. It also overcomes problems associated with electrode surface contamination and satellite/probe surface area ratio for DC Langmuir probes.