Japan Geoscience Union Meeting 2015

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Symbol S (Solid Earth Sciences) » S-CG Complex & General

[S-CG65] 20th anniversary of the Kobe earthquake: Progress in the studies of active faults and strong motion

Tue. May 26, 2015 9:00 AM - 10:45 AM A04 (APA HOTEL&RESORT TOKYO BAY MAKUHARI)

Convener:*Hisashi Nakahara(Solid Earth Physics Laboratory, Department of Geophysics, Graduate School of Science, Tohoku University), Haruo Horikawa(Active Fault and Earthquake Research Center, National Institute for Advanced Science and Technology), Tadashi Maruyama(Ministry of Education, Culture, Sports, Science and Technology), Chair:Haruo Horikawa(Institute of Earthquake and Volcano Geology, National Institute for Advanced Science and Technology), Tadashi Maruyama(Institute of Earthquake and Volcano Geology, National Institute of Advanced Industrial Science and Technology)

10:10 AM - 10:25 AM

[SCG65-05] Ultra-fine amorphous particles preserved in the primary slip zone within the Arima-Takatsuki Tectonic Line

*Satoru ASAYAMA1, Shunya KANEKI1, Tetsuro HIRONO1 (1.Graduate School of Science, Osaka University)

Keywords:active fault, amorphization, quantitive method of amorphous

Friction causes comminution and wearing of minerals in the fault, forming a fine powder that can act as a lubricant (powder lubrication). Such particles are suggested as a potential proxy for identifying the slip zone of the most recent earthquake along a fault, because they were observed only in the latest slip zone within the Taiwan Chelungpu fault that slipped at the 1999 Chi-Chi earthquake. However, the occurrence in the active faults was not fully reported, so we investigate the latest slip zone within the Arima-Takatsuki Tectonic Line.
By applying the quantitative estimation of amorphous component using halo peak area on XRD patterns, we confirmed approximately 20 weight % of the component. We also observed ultrafine particles probably attributed to the amorphous component. Therefore, such particle could be universally observed in the latest slip zone within the active fault.