日本地球惑星科学連合2018年大会

講演情報

[EE] Eveningポスター発表

セッション記号 S (固体地球科学) » S-IT 地球内部科学・地球惑星テクトニクス

[S-IT22] 核-マントルの相互作用と共進化

2018年5月22日(火) 17:15 〜 18:30 ポスター会場 (幕張メッセ国際展示場 7ホール)

コンビーナ:飯塚 毅(東京大学)、渋谷 秀敏(熊本大学大学院先端科学研究部基礎科学部門地球環境科学分野)、土屋 卓久(愛媛大学地球深部ダイナミクス研究センター、共同)、太田 健二(東京工業大学大学院理工学研究科地球惑星科学専攻)

[SIT22-P21] 二次イオン質量分析法を用いた定量同位体イメージング手法開発に向けて

*伊藤 正一1須郷 敬1 (1.京都大学大学院理学研究科)

キーワード:同位体イメージング、SIMS、水素、炭素

Direct ion imaging with secondary ion mass spectrometry (SIMS) has been develped in various fields, such as Material sciences, Earth and planetary sciences, life sciences. Especially, quntitative direct ion imaging techniques has recently developed using SCAPS detector (e.g., Yurimoto et al., 2003).
In this study, we try to develop the stigmatic secondary ion imaging methods using Cameca ims-4fE7 SIMS at Kyoto University. The imaging detector system consists of micro-channnel plate (MCP), florescent screen and Cooled 16bit charged-coupled device (CCD) camera (BU-LN52 Bitrun Co.). This conventional imaging system needs to estimate the calibration parameter with conversion from ion to electron, and from electron to photon.
In principle, each micro-channel of MCP would be different conversion parameter for electron converted from secondary ions. Therefore, in order to estimate the qualitative ion imaging using this system, we need to estimate the error of this conversion parameter in different location of each channel.
In this talk, we introduce the estimation of calibration parameter between the light output count rate read by CCD camera and the count rate of secondary ions incident on MCP with different experimetal session. We will estimate the error of each nonlinear exponent parameter for five places (50 x 50 pixels) and these different parameter cause the error of about 5%. We will discuss it in detail with quantitative isotope imaging with application of high-pressure experiments.