[SGC49-07] Microscale trace-element homogeneity of Fe-based reference metals: constraints from femtosecond laser ablation ICP-MS
Keywords:LA-ICP-MS, imaging, femtosecond laser, galvanometer optical scanner
Microscale trace-element composition of a metallic sample is required for new-product development and quality management in various industrial fields. To calibrate and validate an analytical result, matrix-matched reference material is essential. Although a number of reference metals for trace-element analyses are distributed by many organizations (e.g., National Institute of Standards and Technology, NIST; Bureau of Analysed Samples Ltd., BAS; and The Japan Iron and Steel Federation, JISF), microscale homogeneity of the reference metals are not fully examined.
Laser-Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICPMS) is one of the best equipment to analyze the microscale trace-element composition (e.g., Nesbitt et al., 1997). NIST SRM 610, made of silicate glass, was extensively used for a calibration of microscale trace-element analysis. Non-matrix-matched calibration with NIST SRM 610 for metallic samples was examined using ultraviolet (UV) femtosecond (fs) LA-ICPMS. It provides better sensitivity, stability and accuracy of metallic sample analysis in comparison with those of UV-nanosecond LA-ICPMS, such as ArF-excimer laser and Nd:YAG laser. However, matrix-matched calibration had better accuracy than non-matrix-matched calibration in both femtosecond and nanosecond LA system, respectively (Table 4 of Možná, et al., 2006). It suggests that the homogeneous reference-metals for the microscale trace-element analyses are demanded.
In this presentation, trace-element homogeneity of eleven reference metals (JSS 172-8, JSS 173-8, JSS 174-8, AISI 1045, AISI 1060, BCS 452, BCS 458, ICRM S5/4, ICRM S5/5, NCSHC 11125a, and NCSHC 13013) was evaluated to appraise an availability of reference metals for UV-fsLA-ICPMS analyses.
Laser-Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICPMS) is one of the best equipment to analyze the microscale trace-element composition (e.g., Nesbitt et al., 1997). NIST SRM 610, made of silicate glass, was extensively used for a calibration of microscale trace-element analysis. Non-matrix-matched calibration with NIST SRM 610 for metallic samples was examined using ultraviolet (UV) femtosecond (fs) LA-ICPMS. It provides better sensitivity, stability and accuracy of metallic sample analysis in comparison with those of UV-nanosecond LA-ICPMS, such as ArF-excimer laser and Nd:YAG laser. However, matrix-matched calibration had better accuracy than non-matrix-matched calibration in both femtosecond and nanosecond LA system, respectively (Table 4 of Možná, et al., 2006). It suggests that the homogeneous reference-metals for the microscale trace-element analyses are demanded.
In this presentation, trace-element homogeneity of eleven reference metals (JSS 172-8, JSS 173-8, JSS 174-8, AISI 1045, AISI 1060, BCS 452, BCS 458, ICRM S5/4, ICRM S5/5, NCSHC 11125a, and NCSHC 13013) was evaluated to appraise an availability of reference metals for UV-fsLA-ICPMS analyses.