日本地球惑星科学連合2023年大会

講演情報

[E] オンラインポスター発表

セッション記号 P (宇宙惑星科学) » P-CG 宇宙惑星科学複合領域・一般

[P-CG18] 宇宙・惑星探査の将来計画および関連する機器開発の展望

2023年5月23日(火) 10:45 〜 12:15 オンラインポスターZoom会場 (3) (オンラインポスター)

コンビーナ:横田 勝一郎(大阪大学・理学研究科)、坂谷 尚哉(JAXA 宇宙科学研究所)、小川 和律(宇宙航空研究開発機構)、桑原 正輝(立教大学)

現地ポスター発表開催日時 (2023/5/22 17:15-18:45)

10:45 〜 12:15

[PCG18-P10] Mission to the Moon Environmental Test and Function Calibration of the All-Sky Electrostatic Analyzer

*CHIEN-HSUN LIN1Tzu-Fang Chang1Chih-Yu Chiang1Tzu-En Yen1Sheng-Cheng Tsai1、Yu-Hsiu Liu1Yu-Rong Cheng1、Zhao-Yu Huang1、Ching-Hang Chien1、Chih-Lung Lin2、Chih-Yang Lin3、Yung-Lun Chan3、Tien-Chuan Kuo3 (1.Institute of Space and Plasma Sciences、2.Metal Industries Research & Development Centre (MIRDC)、3.Taiwan Space Agency(TASA))

キーワード:Plasma Environment, Ion Beam, Thermal Vacuum Cycling System, Space Environment Test

We are building an all-sky electrostatic analyzer suitable for plasma observation on the lunar surface. Considering the harsh space environment, we need to conduct various functional verification and space environment tests before launch. In this study we describe the facilities and verification methods we used. The first system is the Space Plasma Operation Chamber, which is mainly used to simulate the vacuum and plasma environment on the lunar surface. It can be used to verify the basic functional performance of the instrument under the environment setting. The second is the space ion beam system, through which an energetic ion beam is generated. We can conduct experiments to obtain signal sensitivity data at the receiving end of the instrument by adjusting the particle energy and incident direction. This is an important data calibration basis before the instrument is launched into space. The third is the thermal vacuum cycling system. The hot and cold temperature generated by this system is used to simulate the temperature difference in the space environment to test whether the instrument can work normally on the lunar surface. We also use this system to verify the functional operation and data reliability at the set temperature.