日本地球惑星科学連合2023年大会

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[J] オンラインポスター発表

セッション記号 P (宇宙惑星科学) » P-PS 惑星科学

[P-PS06] 月の科学と探査

2023年5月26日(金) 15:30 〜 17:00 オンラインポスターZoom会場 (3) (オンラインポスター)

コンビーナ:西野 真木(宇宙航空研究開発機構宇宙科学研究所)、鹿山 雅裕(東京大学大学院総合文化研究科広域科学専攻広域システム科学系)、仲内 悠祐(宇宙航空研究開発機構)、小野寺 圭祐(東京大学地震研究所)

現地ポスター発表開催日時 (2023/5/26 17:15-18:45)

15:30 〜 17:00

[PPS06-P18] Development of Vis-NIR microscopic hyper imager and grinding device for sample-return from the MoonDevelopment of Vis-NIR microscopic hyper imager and grinding device for sample-return from the Moon

*仲内 悠祐1長岡 央2大竹 真紀子3諸田 智克4佐伯 和人5、吉光 徹雄1、森 治1深井 稜汰1、伊庭 靖弘6 (1.宇宙航空研究開発機構、2.理化学研究所、3.会津大学、4.東京大学、5.大阪大学、6.北海道大学)

キーワード:月、LEAD、分光観測

With increasing the opportunities for lunar activities, it is required to develop a compact in-situ analyzer for exploration of lunar surface and selection of return samples. In previous studies, there is possibility that the Apollo samples and lunar meteorites, which are existed on lunar surface for a long time, show brecciated textures, and thermal-metamorphism caused by numerous meteoroid impacts. In such cases, it is difficult to obtain the information (age, texture, etc.) at the time of initial crystallization (e.g., Nagaoka et al. 2023, Icarus). Therefore, it is necessary to decide whether samples were brecciated/metamorphosed or not by observing their textures and compositions, when determining which sample to collect.

We started to develop a compact visible and near infrared microscopic hyper imager for lunar surface investigation and selection of return samples. It is required to obtain continuously spectra form 650 nm to 2000 nm with wavelength resolution under 20 nm and high special resolution 10 µm/pixels. Currently, a lens design has been completed that meets the spatial resolution requirements. This lens is focusable.
Additionally, since we should observe the rock structure in-situ, grinding experiments were initiated in a vacuum environment. Grinded samples are polished and fracture surface of basalt. In about 1 minute of grinding, grinded depth was 400~700 µm in an ambient condition environment and 400 µm in a vacuum environment.