<strong>Temperature-dependent recurrence time of fault-valve behavior at slow-to-fast seismogenic zones revealed by laboratory crack-sealing and silica vein formation</strong>

Masaoki Uno

Presentation information

[E] Oral

S (Solid Earth Sciences ) » S-CG Complex & General

[S-CG56] Science of Slow and Fast Earthquakes

Mon. May 25, 2026 3:30 PM - 5:00 PM Convention Hall (CH-B) (International Conference Hall, Makuhari Messe)

Chairperson:Hamada Yohei(Japan Agency for Marine-Earth Science and Technology), Yeo Thomas(Graduate School of Life and Environmental Sciences University of Tsukuba)

4:00 PM - 4:15 PM

[SCG56-03] Temperature-dependent recurrence time of fault-valve behavior at slow-to-fast seismogenic zones revealed by laboratory crack-sealing and silica vein formation

*Masaoki Uno¹, Ryoto Toda^2,1, Atsushi Okamoto² (1. Department of Earth and Planetary Science, Graduate School of Science, the University of Tokyo, 2. Graduate School of Environmental Studies, Tohoku University)

Keywords:recurrence time of slow earthquakes, fault-valve model, crack-sealing, silica vein