JpGU-AGU Joint Meeting 2017

Session information

[EE] Oral

S (Solid Earth Sciences) » S-SS Seismology

[S-SS07] [EE] Surface Ruptures During Earthquakes: Mapping, Analyses, and Hazard Assessment

Wed. May 24, 2017 9:00 AM - 10:30 AM 101 (International Conference Hall 1F)

convener:Koji Okumura(Graduate School of Letters, Hiroshima University), St?phane Baize(Institut de Radioprotection et de S?ret? Nucl?aire), Nobuhisa Matsuta(Okayama University Graduate School of Education), Takashi Azuma(National Institute of Advanced Industrial Science and Technology), Chairperson:Takashi Azuma(National Institute of Advanced Industrial Science and Technology)

The surface ruptures during earthquakes are invaluable information on the subterranean slip and rupture process. Recent progress in image analyses and laser scanning techniques innovated high-resolution three-dimentional mapping of the ruptures. We firstly examine the high-precision mapping of recent and past surface ruptures and discuss about the way to develop the technique. Secondly, the relationship of the earthquake source processes, strong motion generation, and geologic structure with observed surface deformation is an important unsolved issue. We still do not know much about correlation of slip at depth with slip at surface and about generation of seismic waves above seismogenic zone. Fault displacement hazard assessment is a new challenging technique that follows far behind the bivratory seismic hazard assessment of strong ground motions. Ongoing development of the fault displacement hazard assessment will be discussed together with the surface rupture database of past earthquakes.

9:15 AM - 9:40 AM

*Stéphane Baize1, Johann Champenois1,2, Francesca Cinti4, Timothy Dawson3, Yann Klinger2, James McCalpin6, Koji Okumura7, David Schwartz5, Oona Scotti1, Pilar Villamor8 (1.IRSN, France, 2.IPGP, France, 3.CGS, USA, 4.INGV, Italy, 5.USGS, USA, 6.Geo-Haz Consulting, USA, 7.Hiroshima University, Japan, 8.GNS Science, New Zealand)

Discussion (10:25 AM - 10:30 AM)




Please log in with your participant account.
» Participant Log In