JpGU-AGU Joint Meeting 2017

Presentation information

[EE] Poster

H (Human Geosciences) » H-TT Technology & Techniques

[H-TT19] [EE] GEOSCIENTIFIC APPLICATIONS OF HIGH-DEFINITION TOPOGRAPHY AND GEOPHYSICAL MEASUREMENTS

Tue. May 23, 2017 10:45 AM - 12:15 PM Poster Hall (International Exhibition Hall HALL7)

convener:Yuichi S.Hayakawa(Center for Spatial Information Science, The University of Tokyo), Hiroshi, P. Sato(College of Humanities and Sciences, Nihon University), Shigekazu Kusumoto(Graduate School of Science and Engineering for Research, University of Toyama), Shoichiro Uchiyama(National Research Institute for Earth Science and Disaster Prevention)

[HTT19-P01] Preliminary Study of Scale Effect on Investigating Unknown Object Using Borehole Electrical Resistivity Tomography

*CHIHPING KUO1, YIXUAN LIN1, HSINCHANG LIU2, CHIHHUA LYU1, MEICHUN LIU1 (1.Department and Institute of Civil Engineering and Environmental Informatics, Minghsin University of Science and Technology, 2.Disaster Prevention and Water Environment Research Center, National Chiao Tung University)

Keywords:Borehole Electrical Resistivity Tomography, Geophysical Investigating, Scale Effect

An in-situ experiment for investigating ground improvement using borehole electrical resistivity tomography method, also called BHERT, was performed and proposed at JPGU-2016 as well last year. In the study the simulated results from BHERT presented the roughly three dimensional distributing of the grouted materials of the ground improvement in deep underground soil layers. Despite the clear image being obtained, the operating parameters of BHERT and interpreting method make influence on the result, especially size effect. To clarify more details of the mentioned effect for further adoption, an in-situ with smaller size experiment was performed. A series tests with varies soil materials prepared and objects with different shapes buried inside was performed for setting up a standard reference. The result shows that a correcting factor is existing between object size, field size, and electrical parameters. The factors can be normalized to be unitless.