JpGU-AGU Joint Meeting 2017

講演情報

[JJ] ポスター発表

セッション記号 S (固体地球科学) » S-CG 固体地球科学複合領域・一般

[S-CG73] [JJ] 岩石・鉱物・資源

2017年5月22日(月) 10:45 〜 12:15 ポスター会場 (国際展示場 7ホール)

コンビーナ:齊藤 哲(愛媛大学大学院理工学研究科)、門馬 綱一(独立行政法人国立科学博物館)、野崎 達生(海洋研究開発機構海底資源研究開発センター)、土谷 信高(岩手大学教育学部地学教室)

[SCG73-P07] A grooved glass surface-plate for making a flat polished surface

*Isoji MIYAGI1 (1.Geological Survey of Japan, AIST)

キーワード:EPMA, SIMS, polished sections, ATR micro-FTIR, surface plate

Recent progress in petrological studies are largely depend on the development of micro-analysis techniques. For micro-analysis such as EPMA, SIMS, and ATR micro-FTIR, the flatness of the polished surface is essential to obtain good analytical results.

Conventional polishing techniques involve final buffing with a cloth, which leads to undesired relief that develops on the polished surface near the boundaries of relatively soft and hard materials; for example, soft glass inclusions in hard quartz phenocrysts, and hard glassy ash particles mounted in soft resin.

A fine-grain abrasive film is more rigid than a cloth and so does not follow the surface differences between different materials. Direct interaction between the flat abrasive film and the flat polishing surface, however, can result in sticking or scratching. Furthermore, a thin fluid film between the polishing surface and the abrasive film can cause the abrasive film to slip.

The newly developed grooved glass surface-plate I present here provides advantages over conventional techniques in terms of making a flat polished surface, even if the sample comprises both relatively hard and soft materials. It allows ideal interaction between the flat polishing surface and an attached abrasive film. The grooves prevent the formation of a film of polishing fluid.