[3F3-GS-9] Human interface

[3F3-GS-9-03] Uniform Test Assmbly using Zero-suppressed Binary Decision Diagrams

〇Kazuma Fuchimoto¹, Shin-ichi Minato², Maomi Ueno¹ (1. Graduate School of Informatics and Engineering, The University of Electro-Communications, 2. Graduate School of Informatics, Kyoto University)

Keywords:e-testing, uniform test assembly, zero-suppressed binary decision diagrams

Recently, the necessity of “uniform test forms” for which each form comprises a different set of items but still has equivalent measurement accuracy has been emerging. An important issue for uniform test assembly is to assemble as many uniform tests as possible. Although many automatic uniform test assembly methods exist, the maximum clique using the integer programming method is known to assemble the greatest number of uniform tests with the highest measurement accuracy. However, the method requires one month or more to assemble 450,000 tests due to the high time complexity of integer programming. This study proposes a new uniform assembly using zero-suppressed binary decision diagrams (ZDD). A ZDD is a graphical representation for a set of item combinations. This is derived by reducing a binary decision tree. In the proposed method, each node in the binary decision tree corresponds to an element of an item bank and has two edges if the item (node) is contained in a uniform test. Furthermore, all equivalent nodes (having the same measurement accuracy and the same test length) are shared. Finally, the proposed method can assemble 450,000 tests within 24 hours.