[4R1-OS-13] OS-13

[4R1-OS-13-01] (OS invited talk) Applications of SAT and BDD in testing, verification, and reliability evaluation

〇Tatsuhiro Tsuchiya¹ (1. Osaka University)

Keywords:SAT, BDD, reliability evaluation, testing, verification

We describe the applications of SAT and BDD that our laboratory is working on. Specific topics include the design of software tests based on combinatorial design, automatic verification using model checking, and reliability evaluation by probabilistic fault-tree analysis. We outline how SAT and BDD are applied to these problems and discuss possible directions of future research.