[27a-A2-1~9] 3.4 Optical measurement

[27a-A2-9] △Electric field profile evaluation at waveguide facet by using reverse fourier transformation of far-field pattern

^○（M2）Hirohito Hokazono¹, Daisuke Nakashima¹, Jiao Chen¹, Miki Tsujino¹, Kiichi Hamamoto¹ (Kyushu Univ.¹)

Keywords:遠視野像、光フィールド、フーリエ変換