The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Poster presentation)

01. Applied Physics in General » 1.7 Instrumentation and measurement

[27a-PA5-1~9] 1.7 Instrumentation and measurement

Wed. Mar 27, 2013 9:30 AM - 11:30 AM PA5 (1st gymnasium)

[27a-PA5-9] A study about the small defect and small particle detection on thin film by Glancing method of Multi-angular Images by the cross Correlation

Masashi Yamamoto1, Mitunori Tone2, Hiroshi Kubota1 (Kumamoto Univ. GSST1, Kumamoto Univ.2)

Keywords:欠陥検査