[27p-B8-1~18] 9.5 New functional materials and new physical properties

[27p-B8-3] △Characterization of Electronic Emission through Si-Nanocrystals/ Si-Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy

^○（M1）Daichi Takeuchi¹, Katsunori Makihara¹, Mitsuhisa Ikeda², Seiichi Miyazaki¹, Hirokazu Kaki³, Tsukasa Hayashi³ (Nagoya Univ.¹, Hiroshima Univ.², NISSIN ELECTRIC Co. Ltd.³)

Keywords:電子放出、柱状Si