The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

09. Applied Materials Science » 9.4 Thermoelectric conversion

[27p-B9-1~17] 9.4 Thermoelectric conversion

Wed. Mar 27, 2013 1:15 PM - 6:00 PM B9 (K2 4F-1407)

[27p-B9-5] Seebeck coefficient measurement of SOI layer by KFM

Kazutoshi Miwa1, Yuhei Suzuki1, Faiz Salleh1,2, ○Hiroya Ikeda1 (Shizuoka Univ.1, JSPS Research Fellow2)

Keywords:ゼーベック係数、Kelvin-probe force microscopy