The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

07. Beam Technology and Nanofabrication » 7.3 Lithography

[28p-B2-1~13] 7.3 Lithography

Thu. Mar 28, 2013 1:30 PM - 5:00 PM B2 (K2 3F-1302)

[28p-B2-4] Problem Solving of Directional Pattern Width Difference in Projection Exposure Using a Four-Line Gradient Index Lens Array

Toshiyuki Horiuchi1, Takeru Suzuki1, Hiroshi Kobayashi1 (Tokyo Denki Univ.1)

Keywords:屈折率分布型レンズアレイ、走査投影露光、異方性