[28p-G22-17] △Identification of Origin of Z1/2 Center in 4H-SiC by DLTS and EPR
Keywords:炭素空孔、深い準位、電子線照射
Regular sessions(Oral presentation)
15. Crystal Engineering » 15.6 IV-group-based compounds
Thu. Mar 28, 2013 1:45 PM - 6:45 PM G22 (B5 4F-2406)
Keywords:炭素空孔、深い準位、電子線照射