The 60th JSAP Spring Meeting,2013

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Regular sessions(Poster presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[28p-PB5-1~5] 6.6 Probe microscopy

Thu. Mar 28, 2013 4:00 PM - 6:00 PM PB5 (2nd gymnasium)

[28p-PB5-3] Calibration of Spring Constant for High-Stiffness Cantilevers

○Akihiro Noda1, Kousuke Kitaura1, Kei Kobayashi2, Hirohumi Yamada1 (Dept.of Electronic Sci. & Eng.,Kyoto Univ.1, SACI,Kyoto Univ.2)

Keywords:ばね定数