[29a-G8-1~11] 12.2 Evaluation and basic properties

[29a-G8-5] Local surface potential measurements of operating organic crystalline field-effect transistors by Kelvin-probe force microscopy

^○Tomoharu Kimura¹, Kei Kobayashi², Hirofumi Yamada¹ (Dept. of Electronic Sci. & Eng., Kyoto Univ.¹, SACI, Kyoto Univ.²)

Keywords:ケルビンプローブ原子間力顕微鏡、有機半導体