[29a-PB3-1~9] 9.3 Nanoelectronics

[29a-PB3-6] Control of Electrical Properties of Series-Connected Nanogaps during Field-Emission-Induced Electromigration

^○Souichi Ishii¹, Ryutaro Suda¹, Mitsuki Ito¹, Akihiro Hirata¹, Jun-ichi Shirakashi¹ (Tokyo Univ. Agr. & Tech.¹)

Keywords:エレクトロマイグレーション、集積化、ナノギャップ