The 60th JSAP Spring Meeting,2013

Presentation information

Symposium(Oral presentation)

Symposium » ・Ultrasonic Electronics

[29p-B5-1~10] Ultrasonic Electronics

Fri. Mar 29, 2013 1:30 PM - 5:45 PM B5 (K2 4F-1401)

[29p-B5-10] High-Selectivity Imaging of Closed Cracks Using Fundamental Wave Amplitude Difference (FAD) Method

Yoshikazu Ohara1, Masako Ikeuchi1, Kentaro Jinno1, Kazushi Yamanaka1 (Tohoku Univ.1)

Keywords:非線形超音波、基本波のしきい値現象、閉じたき裂