[29p-D3-1~20] 6.6 Probe microscopy

[29p-D3-14] Chemical Identification with UHV Atomic Force Microscopy in Vertical Mode.

^○Yohei Toriyama¹, Denis Damiron^1,2, Othman Muhammad¹, Pierre Allain^1,2, Yoshihiro Obata¹, Dai Kobayashi¹, Hideki Kawakatsu¹ (IIS,Univ Tokyo¹, LIMMS, IIS, Univ Tokyo²)

Keywords:原子間力顕微鏡