The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[29p-D3-1~20] 6.6 Probe microscopy

Fri. Mar 29, 2013 1:30 PM - 6:45 PM D3 (C5 3F-324)

[29p-D3-4] △Precise analysis of force maps acquired on surfactant assembly by FM-AFM

○（PC）Ken-ichi Umeda1, Fumiaki Ito1, Kazuhiro Suzuki1, Kei Kobayashi2, Hirofumi Yamada1 (Dept. of Electronic Sci. & Eng., Kyoto Univ.1, SACI, Kyoto Univ.2)

Keywords:走査プローブ顕微鏡、周波数変調原子間力顕微鏡、界面活性剤