The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

15. Crystal Engineering » 15.8 Crystal evaluation, nanoimpurities and crystal defects

[29p-G16-1~21] 15.8 Crystal evaluation, nanoimpurities and crystal defects

Fri. Mar 29, 2013 1:30 PM - 7:15 PM G16 (B5 3F-2304)

[29p-G16-12] In-Diffusion and Annealing of Nickel in Dislocation-Free n-Type Silicon

Shuji Tanaka1, Seiji Takami1, Takuya Mitoma1, Koitirou Noguti1 (Fukuoka Institute of Technology1)

Keywords:電気的活性ニッケル原子、解離機構、空格子点の生成消滅